Mound defect modeling in yield forecasts

نویسندگان

چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Modeling of Real Defect Outlines for Defect Size Distribution and Yield Prediction

For efficient yield prediction defects are usually modeled by circular discs or squares. This paper presents a more accurate model that considers the real outline of physical defects. To utilize this model only the maximum and the minimum extension of detected defects have to be determined. That can be done easily using a checkerboard test structure including a defect localization procedure.

متن کامل

Do Multi-Model Ensemble Forecasts Yield Added Value?

The THORPEX goal of improving weather forecasts from one day to two weeks suggests the combination of multi-model and multi-initial-condition ensembles of simulations into a probabilistic forecast of some kind. This contribution presents a simple methodology for combining forecasts (be they high resolution or ensemble forecasts) into a predictive distribution function of a chosen target variabl...

متن کامل

Topological defect launches 3D mound in the active nematic sheet of neural progenitors

Cultured stem cells have become a standard platform not only for regenerative medicine and developmental biology but also for biophysical studies[1, 2]. Yet, the characterization of cultured stem cells at the level of morphology and macroscopic patterns resulting from cell-to-cell interactions remain largely qualitative, even though they are the simplest features observed in everyday experiment...

متن کامل

Freight transport development forecasts in enterprises management

In this study, an investigation of long-term forecasts relating to the development of the transport sector in Poland is performed, including the ones by 2030 and 2050. Selected transport development forecasts from the perspective of the membership of Poland in the European Union are presented and most of all, from the perspective of national studies. The basement for the review was the prognosi...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: IEEE Transactions on Semiconductor Manufacturing

سال: 1994

ISSN: 0894-6507

DOI: 10.1109/66.330280